Test Suite Minimization for Embedded Nondeterministic Finite State Machines
نویسندگان
چکیده
This paper presents a method for minimizing test suites for embedded, nondeterministic Finite State Machines. The method preserves the fault coverage of the original test suite, and can be used in conjunction with any technique for generating test suites. The minimization is achieved by detecting and deleting redundant test cases in the test suite. The proposed method is an extension of the work presented in [YCL98].
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تاریخ انتشار 1999